How to test efficiently with advanced forcing features in TEMS™ Pocket?

TEMS Pocket introduces, as a world-first, a wide array of advanced control functions on Samsung’s proprietary baseband chipset, usually referred to as the Shannon chipset: RAT lock, Band lock, EARFCN/PCI lock, UARFCN/SC lock and ARFCN lock.

Many of the new devices supporting these features are also LTE Category 20, which allows testing of 7 Carrier Aggregation.

Forcing features enable engineers to test networks in a non-intrusive fashion, where the alternative would be to change networks settings, test during odd hours or even de-commission sites temporarily. All of the alternatives are costly and error prone in comparison.

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